Comparing durum wheat cultivars by genotype x yield x trait and genotype x trait biplot method

dc.authorid0000-0002-8812-8847en_US
dc.contributor.authorKendal, Enver
dc.date.accessioned2021-07-05T10:52:36Z
dc.date.available2021-07-05T10:52:36Z
dc.date.issued2019en_US
dc.departmentMAÜ, Meslek Yüksekokulları, Kızıltepe Meslek Yüksekokulu, Bitkisel ve Hayvansal Üretim Bölümüen_US
dc.description.abstractThe specification of the most convenient cultivars based on multiple trait indices is a new approach in durum wheat (Triticum durum Desf.) adaptation and stability studies. This approach helps to define the best cultivar based on multiple traits and multiple locations because cultivars are affected by unpredictable climatic conditions. Some traits (ears per square meter, spike length, number of grains per spike, spike yield, and leaf chlorophyll content among others) can be produced for primary breeding purposes because they are influenced by environmental factors and indirectly affect grain yield and quality. Therefore, in the present study, the new genotype × yield trait (GYT) biplot approach was used to identify the best cultivar among 10 durum wheat cultivars based on multiple environments (8) and multiple traits (18). Cultivar ranking was examined by a superiority index that combined yield and other target traits with the GYT biplot. The general adaptability of each cultivar in terms of all the traits indicated differences based on environment means, and significant differences were found between varieties for the GYT biplot. In the GYT biplot, yield-trait combinations clearly indicated the most stable cultivars, whereas in the genotype × trait (GT) biplot, the best cultivars were not defined for all traits. ‘Sariçanak’ was ranked as the best combination of physio-morphological traits with grain yield, ‘Zühre’ was the best for more quality traits, and ‘Güneyyildizi’ was the best for both physio-morphological and quality traits in the GYT biplot. The GYT biplot combines traits with yield and can help the visual identification of the best cultivars; it is better than the GT biplot method.en_US
dc.identifier.citationKendal, Enver. (2019). Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method. Chilean journal of agricultural research, 79(4), 512-522. https://dx.doi.org/10.4067/S0718-58392019000400512en_US
dc.identifier.doi10.4067/S0718-58392019000400512en_US
dc.identifier.endpage522en_US
dc.identifier.issue4en_US
dc.identifier.scopus2-s2.0-85075290406en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.startpage512en_US
dc.identifier.urihttps://dx.doi.org/10.4067/S0718-58392019000400512
dc.identifier.urihttps://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=11&SID=C6BtXWrjaq3DaciuQrK&page=1&doc=1
dc.identifier.urihttps://hdl.handle.net/20.500.12514/2645
dc.identifier.volume79en_US
dc.identifier.wosWOS:000492756200002en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherCHILEAN JOURNAL OF AGRICULTURAL RESEARCHen_US
dc.relation.ispartofCHILEAN JOURNAL OF AGRICULTURAL RESEARCHen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectDurum; cultivar; multiple; environment; trait; genotype × yield × trait.en_US
dc.titleComparing durum wheat cultivars by genotype x yield x trait and genotype x trait biplot methoden_US
dc.typeArticleen_US

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